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79LV0832RT2QE-20 Datasheet(PDF) 5 Page - Maxwell Technologies |
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79LV0832RT2QE-20 Datasheet(HTML) 5 Page - Maxwell Technologies |
5 / 21 page 5 01.10.05 Rev 8 All data sheets are subject to change without notice ©2005 Maxwell Technologies All rights reserved Low Voltage 8 Megabit (256K x 32-Bit) EEPROM MCM 79LV0832 Output Voltage Data Lines: V CCMin, IOL = 2.1mA RDY/BSY_Line: V CC Min, IOL = 12mA Data Lines: V CC Min, IOH = -400µ A RDY/BSY_Line: V CC Min, IOH = -12mA All Outputs: V CCMin, IOH=-100uA V OL V OL V OH V OH 1, 2, 3 -- 2.4 2.4 V CC-0.3V 0.4 0.4 -- -- V V V V V 1. All Inputs are tied to Vcc with a 5.5K W resistor, except for RES which is 30KW. 2. For RES I LI=800uA max. 3. Only one CE active (low) at a time TABLE 7. 79LV0832 AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION 1 (V CC = 3.3V ± 10%, T A = -55 TO +125° C) PARAMETER SYMBOL SUBGROUPS MIN MAX UNIT Address Access Time CE = OE = V IL, WE = VIH -200 -250 t ACC 9, 10, 11 -- -- 200 250 ns Chip Enable Access Time OE = V IL, WE = VIH -200 -250 t CE 9, 10, 11 -- -- 200 250 ns Output Enable Access TIme CE = V IL, WE = VIH -200 -250 t OE 9, 10, 11 0 0 110 120 ns Output Hold to Address Change CE = OE =V IL, WE = VIH -200 -250 t OH 9, 10, 11 0 0 -- -- ns Output Disable to High-Z 2 CE = V IL, WE = VIH -200 -250 CE = OE = V IL, WE = VIH -200 -250 t DF t DFR 9, 10, 11 0 0 0 0 50 50 300 350 ns ns RES to Output Delay CE = OE = V IL, WE = VIH 3 -200 -250 T RR 9, 10, 11 0 0 525 550 ns 1. Test conditions: input pulse levels = 0.4V to 2.2V; input rise and fall times < 20 ns; output load = 1 TTL gate + 100 pF (including scope and jig); reference levels for measuring timing = 0.8 V/1.8 V. 2. t DF and tDFR are defined as the time at which the output becomes an open circuit and data is no longer driven. 3. Guaranteed by design. TABLE 6. 79LV0832 DC ELECTRICAL CHARACTERISTICS (V CC = 3.3V ± 10%, T A = -55 TO +125° C) PARAMETER TEST CONDITION SYMBOL SUBGROUPS MIN MAX UNITS |
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