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27C010TRT1FI-20 Datasheet(PDF) 4 Page - Maxwell Technologies |
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27C010TRT1FI-20 Datasheet(HTML) 4 Page - Maxwell Technologies |
4 / 14 page 4 All data sheets are subject to change without notice ©2001 Maxwell Technologies All rights reserved. 1 Megabit (128K x 8-Bit) - OTP EPROM 27C010T 12.12.01 Rev 2 TABLE 7. 27C010T AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION 1 (V CC = 5V ± 10%, VPP = VSS, TA = -55 TO +125 ° C, UNLESS OTHERWISE SPECIFIED) 1. Test conditions: - Input pulse levels 0.45V/2.4V - Input rise and fall times < 10 ns - Output load 1 TTL gate + 100 pF (including scope and jig) - Referenced levels for measuring timing 0.8V/2.0V PARAMETER TEST CONDITION SYMBOL SUB GROUPS MIN MAX UNIT Address Access Time - 120 - 150 - 200 CE = OE = V IL t ACC 9, 10, 11 -- -- -- 120 150 200 ns Chip Enable Access Time - 120 - 150 - 200 OE = V IL t CE 9, 10, 11 -- -- -- 120 150 200 ns Output Enable Access TIme - 120 - 150 - 200 CE = V IL t OE 9, 10, 11 -- -- -- 60 70 70 ns Output Hold to Address Change - 120 - 150 - 200 CE = V IL t OH 9, 10, 11 0 0 0 -- -- -- ns Output Disable to High-Z 2 - 120 - 150 - 200 2. t DF is defined as the time at which the output becomes an open circuit and data is no longer driven. CE = OE = V IL t DF 9, 10, 11 0 0 0 50 50 50 ns |
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