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MC74AC157D Datasheet(PDF) 3 Page - ON Semiconductor |
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MC74AC157D Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 10 page MC74AC157, MC74ACT157 http://onsemi.com 3 MARKING DIAGRAMS A = Assembly Location WL, L = Wafer Lot YY, Y = Year WW, W = Work Week AC157 AWLYWW MC74AC157N AWLYYWW AC 157 ALYW ACT157 AWLYWW ACT 157 ALYW MC74ACT157N AWLYYWW PDIP−16 SOIC−16 TSSOP−16 EIAJ−16 74AC157 ALYW 74ACT157 ALYW MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage (Referenced to GND) −0.5 to +7.0 V VIN DC Input Voltage (Referenced to GND) −0.5 to VCC +0.5 V VOUT DC Output Voltage (Referenced to GND) −0.5 to VCC +0.5 V IIN DC Input Current, per Pin ±20 mA IOUT DC Output Sink/Source Current, per Pin ±50 mA ICC DC VCC or GND Current per Output Pin ±50 mA Tstg Storage Temperature −65 to +150 °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Typ Max Unit V Supply Voltage ′AC 2.0 5.0 6.0 V VCC Supply Voltage ′ACT 4.5 5.0 5.5 V VIN, VOUT DC Input Voltage, Output Voltage (Ref. to GND) 0 − VCC V I t Ri d F ll Ti (N t 1) VCC @ 3.0 V − 150 − tr, tf Input Rise and Fall Time (Note 1) ′AC Devices except Schmitt Inputs VCC @ 4.5 V − 40 − ns/V r, f AC Devices exce t Schmitt In uts VCC @ 5.5 V − 25 − t t Input Rise and Fall Time (Note 2) VCC @ 4.5 V − 10 − ns/V tr, tf In ut Rise and Fall Time (Note 2) ′ACT Devices except Schmitt Inputs VCC @ 5.5 V − 8.0 − ns/V TJ Junction Temperature (PDIP) − − 140 °C TA Operating Ambient Temperature Range −40 25 85 °C IOH Output Current − High − − −24 mA IOL Output Current − Low − − 24 mA 1. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times. 2. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times. |
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