10

FN8124.0

March 18, 2005

ABSOLUTE MAXIMUM RATINGS

Temperature under bias .................... -65°C to +135°C

Storage temperature ......................... -65°C to +150°C

Voltage on any pin with

respect to ground .................................-1.0V to 7.0V

DC output current ................................................ 5 mA

Lead temperature (soldering, 10 seconds) ........ 300°C

COMMENT

Stresses above those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device.

This is a stress rating only; the functional operation of

the device (at these or any other conditions above

those indicated in the operational sections of this specifi-

cation) is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect device reliability.

Notes: (1) The device enters the active state after any start, and remains active until: 9 clock cycles later if the device select bits in the slave

high voltage cycle; or 9 clock cycles after any start that is not followed by the correct device select bits in the slave address byte.

Symbol

Parameter

Min.

Max.

Unit

Test Conditions

Active supply current serial

read or serial write (does

not include the nonvolatile

store operation)

2.0

mA

SDA = Read/Write Operation, CE, OE, WE,

Average active supply

current during serial non-

volatile store operation

3.0

mA

Active supply current

volatile NOVRAM read

3.0

mA

Active supply current

volatile NOVRAM write

3.0

mA

Average active supply

current over NOVRAM

store, or active current dur-

ing recall

3.0

mA

D0-D3, O0-O3, RESET = Open CAP is tied to

call

Standby current

50

µAV

Input leakage current

10

µAV

Output leakage current

10

µAV

(2)

Input LOW voltage

-0.5

V

Input HIGH voltage

V

Schmitt trigger input

hysteresis

V

Output LOW voltage

0.4

V

Output HIGH voltage

V

X4C105