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Data Acquisition Microcontroller
XE88LC05
4
D0109-40
2 Absolute maximum ratings
Stresses beyond these listed in this chapter may cause permanent damage to the device. No
functional operation is implied at or beyond these conditions. Exposure to these conditions for
an extended period may affect the device reliability.
Note:
1) For unprogrammed MTP devices. Blocking bits and software must be rewritten in MTP de-
vices if storage temperature exceedes storage temperature for programmed devices.
These devices are ESD sensitive. Although these devices feature proprietary ESD protection
structures, permanent damage may occur on devices subjected to high energy electrostatic
discharges. Proper ESD precautions have to be taken to avoid performance degradation or
loss of functionality.
Parameter
Value
Remarks
VBAT with respect to VSS
-0.3V to 6.0V
Input voltage on any input pin
VSS-0.3V to VBAT+0.3V
Storage temperature
-55
°Cto 125°C1
Storage temperature for programmed MTP devices
-40
°Cto 85°C1
Table 2.1:
Absolute maximum ratings
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