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ULN2003 Datasheet(PDF) 5 Page - Unisonic Technologies |
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ULN2003 Datasheet(HTML) 5 Page - Unisonic Technologies |
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5 / 10 page  ULN2003 LINEAR INTEGRATED CIRCUIT TEST CIRCUIT Components in the test circuits are used only to obtain and confirm the device characteristics. These components and circuits are not guaranteed to prevent malfunction or failure from occurring in the application equipment. OPEN VIN OPEN ILEAK VCE OPEN OPEN IR VR VIN(ON) OPEN IOUT VCE OPEN IOUT IIN(OFF) OPEN IOUT VCE,VCEO(SAT) IIN hFE= OPEN IIN(ON) OPEN VIN 1. ILEAK 2. VCEO(SAT),hFE 3. IIN(ON) 4. IIN(OFF) 5. VIN(ON) 6. IR IOUT IIN VIN UNISONICTECHNOLOGIESCO.,LTD 5 of 10 www.unisonic.com.tw QW-R113-001.Q |
Similar Part No. - ULN2003_17 |
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Similar Description - ULN2003_17 |
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