ZL40121

Data Sheet

4

Zarlink Semiconductor Inc.

Absolute Maximum Ratings

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate

conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed

specifications and the test conditions, see the Electrical Characteristics.

Note 2: Human body model, 1.5k

Ω in series with 100pF. Machine model, 20Ωin series with 100pF.

Note 3: 0.8kV between the pairs of +INA, -INA and +INB pins only. 2kV between supply pins, OUTA or OUTB pins and any input pin.

Note 4: ±100mA applied to input and output pins to force the device to go into "latch-up". The device passes this test to JEDEC spec

17.

Note 5: Positive and Negative supply transient testing increases the supplies by 20% for 100ms.

Operating Range

Parameter

Symbol

Min

Max

Units

1

Vin Differential

±1.2

V

2

Output Short Circuit Protection

See Apps

Note in this

data sheet

3

Supply voltage

V+, V-

±6.5

V

4

Voltage at Input Pins

V-

V+

V

5

Voltage at Output Pins

V-

V+

V

6

EDS Protection

(HBM Human Body Model)

(see Note 2)

2

(see Note 3)

kV

7

Storage Temperature

-55

+150

°C

8

Latch-up test

for 100ms

(see Note 4)

9

Supply transient test

20% pulse

for 100ms

(see Note 5)

Characteristic

Min

Typ

Max

Units

Comments

Supply Voltage (Vcc)

±4.0

V

Operating Temperature (Ambient)

-40

+85

°C

Junction to Ambient resistance

Rth(j-a)

150

°C

4 layer

FR4 board

Junction to Case resistance

Rth(j-c)

60

°C

4 layer

FR4 board