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DS75453N Datasheet(PDF) 5 Page - National Semiconductor (TI) |
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DS75453N Datasheet(HTML) 5 Page - National Semiconductor (TI) |
5 / 16 page DC Test Circuits TLF5824 – 15 Both inputs are tested simultaneously FIGURE 1 VIH VOL TLF5824 – 16 Each input is tested separately FIGURE 2 VIL VOH TLF5824 – 17 Each input is tested separately FIGURE 3 VI IIL TLF5824 – 18 Each input is tested separately FIGURE 4 II IIH TLF5824 – 19 Each input is tested separately FIGURE 5 IOS TLF5824 – 20 Both gates are tested simultaneously FIGURE 6 ICCH ICCL TLF5824 – 21 Circuit Under Input Test Other Input Output Apply Measure DS55451 VIH VIH VOH IOH VIL VCC IOL VOL DS55452 VIH VIH IOL VOL VIL VCC VOH IOH DS55453 VIH Gnd VOH IOH VIL VIL IOL VOH DS55454 VIH Gnd IOL VOL VIL VIL VOH IOH FIGURE 7 VIH VIL IOH VOL Note A Each input is tested separately Note B When testing DS55453DS75453 DS55454DS75454 input not under test is grounded For all other circuits it is at 45V TLF5824 – 22 FIGURE 8 VI VIL Each input is tested separately TLF5824 – 23 FIGURE 9 II IIH Both gates are tested simultaneously TLF5824 – 24 FIGURE 10 ICCH ICCL for AND NAND Circuits Both gates are tested simultaneously TLF5824 – 25 FIGURE 11 ICCH ICCL for OR NOR Circuits 5 |
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