5

ADS7046

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SBAS785 – DECEMBER 2016

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Copyright © 2016, Texas Instruments Incorporated

(1)

Ideal input span; does not include gain or offset error.

(2)

See Figure 31, Figure 29, and Figure 30 for statistical distribution data for INL, offset error, and gain error.

(3)

LSB means least significant bit.

(4)

See the OFFCAL State section for details.

(5)

All specifications expressed in decibels (dB) refer to the full-scale input (FSR) and are tested with an input signal 0.5 dB below full-scale,

unless otherwise noted.

(6)

Calculated on the first nine harmonics of the input frequency.

6.5 Electrical Characteristics

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

ANALOG INPUT

Full-scale input voltage

0

AVDD

V

Absolute input voltage

range

AINP to GND

–0.1

AVDD + 0.1

V

AINM to GND

–0.1

0.1

Sampling capacitance

16

pF

SYSTEM PERFORMANCE

Resolution

12

Bits

NMC

No missing codes

12

Bits

Integral nonlinearity

–1

±0.3

1

DNL

Differential nonlinearity

–0.5

±0.15

0.5

LSB

(2)

Offset error

–3

±1

3

LSB

Offset error drift with

temperature

1.75

ppm/°C

(2)

Gain error

–0.1

±0.01

0.1

%FS

Gain error drift with

temperature

0.5

ppm/°C

SAMPLING DYNAMICS

Conversion time

ns

Acquisition time

80

ns

Maximum throughput

rate

60-MHz SCLK, AVDD = 2.35 V to 3.6 V

3

MHz

Aperture delay

3

ns

Aperture jitter, RMS

12

ps

DYNAMIC CHARACTERISTICS

SNR

69

71.2

dB

70.4

THD

Total harmonic

–86

dB

–85

–84.5

SINAD

Signal-to-noise and

69

71.1

dB

70.9

70.8

SFDR

Spurious-free dynamic

90

dB

90

88

Full-power bandwidth

At –3 dB

200

MHz